DocumentCode :
3507760
Title :
Fast automated segmentation of femoral heads in fluoroscopic X-ray images
Author :
Wang, Lei ; Kohnen, Michael ; Friman, Ola ; Hahn, Horst K.
Author_Institution :
Inst. for Med. Image Comput., Fraunhofer MEVIS, Bremen, Germany
fYear :
2011
fDate :
March 30 2011-April 2 2011
Firstpage :
984
Lastpage :
988
Abstract :
In fluoroscopic tracking for fractured femur bone fixation, a precise identification of the femoral head provides valuable guidance for positioning the implant instruments such as nails and screws. Noise, occlusions and weak edges challenge the task of automatically segmenting the femoral head. In this paper, a fast and fully automated method to precisely delineate the femoral head in fluoroscopic X-ray images is presented. The proposed method comprises two stages: First, a candidate circle detection stage using a set of curved Gabor filters and a Gabor-based Hough transform is applied to estimate a few candidate circles approximating the femoral head. Second, a fine circle determination stage extracts the target circle from the candidates by analyzing the anatomical features of the femoral head and its spatial relation to the acetabulum. The validity and robustness of the method were tested on a set of 1184 fluoroscopic images from different vendors.
Keywords :
Gabor filters; Hough transforms; biomechanics; bone; diagnostic radiography; edge detection; feature extraction; fracture; image segmentation; medical image processing; prosthetics; Gabor-based Hough transform; acetabulum; anatomical feature extraction; circle detection; curved Gabor filters; fast automated segmentation; femoral heads; fluoroscopic X-ray images; fractured femur bone fixation; implant positioning; nails; noise; occlusions; screws; weak edges; Fasteners; Feature extraction; Head; Image edge detection; Pixel; Three dimensional displays; X-ray imaging; Femoral head segmentation; Gabor filter; Hough transform; RANSAC algorithm;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Biomedical Imaging: From Nano to Macro, 2011 IEEE International Symposium on
Conference_Location :
Chicago, IL
ISSN :
1945-7928
Print_ISBN :
978-1-4244-4127-3
Electronic_ISBN :
1945-7928
Type :
conf
DOI :
10.1109/ISBI.2011.5872567
Filename :
5872567
Link To Document :
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