DocumentCode :
3507796
Title :
Cable parameter variation due to skin and proximity effects: Determination by means of Finite Element Analysis
Author :
Cirino, Andrè W. ; De Paula, Hèlder ; Mesquita, Renato C. ; Saraiva, E.
Author_Institution :
Dept. de Eng. Eletr., UFMG, Belo Horizonte, Brazil
fYear :
2009
fDate :
3-5 Nov. 2009
Firstpage :
4073
Lastpage :
4079
Abstract :
Computational simulations involving problems of power quality, electromagnetic transients and electromagnetic compatibility, among others, require the application of time domain cable models appropriate for high-frequency studies, able to represent the cable parameter variation in relation to frequency. Most of the models that satisfy this condition require, to be elaborated, input data regarding the cable resistance and inductance for different frequencies. Since the measurement of such parameters is oftentimes not feasible, the possibility of their determination from analytical or computational methods is highly desirable. Routines of the type ¿cable-line constants¿, commonly featured in commercial simulators, are widely used for this purpose; nevertheless, they present limitations that lead to inaccuracy and restrictions in their applicability. In this context, a methodology for cable parameter determination, based on finite element analysis (FEA), is presented, which overcomes these problems and thus arises as a very attractive tool for cable/line modeling.
Keywords :
finite element analysis; power cables; skin effect; time-domain analysis; FEA; cable inductance; cable parameter variation; cable resistance; cable-line constants; cable-line modeling; computational simulations; electromagnetic compatibility; electromagnetic transients; finite element analysis; power quality; proximity effects; skin effects; time domain cable models; Communication cables; Computational modeling; Electromagnetic compatibility; Electromagnetic modeling; Finite element methods; Frequency; Inductance; Power quality; Proximity effect; Skin; Cable/line modeling; Finite Element Analysis (FEA); cable/line parameters; proximity effect; skin effect;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics, 2009. IECON '09. 35th Annual Conference of IEEE
Conference_Location :
Porto
ISSN :
1553-572X
Print_ISBN :
978-1-4244-4648-3
Electronic_ISBN :
1553-572X
Type :
conf
DOI :
10.1109/IECON.2009.5415128
Filename :
5415128
Link To Document :
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