DocumentCode
3507800
Title
Very large arrays of flip-chip bonded 1.55-/spl mu/m photodiodes for spectroscopic monitoring of WDM networks
Author
Goossen, K.W. ; Cunningham, John E. ; Zhang, Ge ; Walker, James Alfred
Author_Institution
Bell Labs., Lucent Technol., Holmdel, NJ, USA
fYear
1998
fDate
3-8 May 1998
Firstpage
54
Lastpage
55
Abstract
Summary form only given. We have demonstrated and analyzed very large arrays of flip-chip bonded InGaAs/InP photodetectors, in particular paying attention to how their series and shunt resistances affect zero-bias photocurrent and therefore yield for spectrometer applications. Our device design results in very low series resistance of the diode and high photocurrent collection efficiency at zero-bias. It was shown that for an integrated circuit array wherein attention is paid to eliminating resistance between the flip-chip bonding pad and the feedback resistor node, the effect of leaky diodes is nearly eliminated.
Keywords
arrays; flip-chip devices; gallium arsenide; indium compounds; integrated optoelectronics; optical communication equipment; optical fibre networks; p-i-n photodiodes; photodetectors; wavelength division multiplexing; 1.55 micron; InGaAs-InP; WDM networks; feedback resistor node; flip-chip bonded InGaAs/InP photodetectors; flip-chip bonding pad; high photocurrent collection efficiency; integrated circuit array; leaky diodes effect; p-i-n photodiodes; photodiode arrays; series resistance; shunt resistance; spectrometer applications; spectroscopic monitoring; very large arrays; zero-bias photocurrent; Bonding; Diodes; Indium gallium arsenide; Indium phosphide; Integrated circuit yield; Photoconductivity; Photodetectors; Photodiodes; Resistors; Spectroscopy;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 1998. CLEO 98. Technical Digest. Summaries of papers presented at the Conference on
Conference_Location
San Francisco, CA, USA
Print_ISBN
1-55752-339-0
Type
conf
DOI
10.1109/CLEO.1998.675858
Filename
675858
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