Title :
A novel temperature compensation method for SAW devices using direct bonding techniques
Author :
Onishi, K. ; Namba, A. ; Sato, H. ; Ogura, T. ; Seki, S. ; Taguchi, Y. ; Tomita, Y. ; Kawasaki, O. ; Eda, K.
Author_Institution :
Device Eng. Dev. Center, Matsushita Electr. Ind. Co. Ltd., Kadoma, Japan
Abstract :
We have developed a novel temperature compensation method for SAW devices using a direct bonding technique. The SAW device applied this method was composed of a conventional piezoelectric substrate such as LiTaO3 and LiNbO3, directly bonded without any bonding agents to a glass substrate having a relatively low thermal expansion coefficient (TEC). The piezoelectric substrate and the glass substrate were bonded in an atomic scale and the interface was very uniform. Therefore, the thermal strain at the surface of the bonded substrate caused by the difference between the TECs of the substrates was quite uniform and stable. With this structure, the thermal expansion of the piezoelectric substrate was restrained and the elastic constant of the piezoelectric substrate was changed by the thermal strain. Using this technique, we have succeeded to improve the temperature coefficient of frequency (TCF) of the SAW devices without causing any deterioration in the frequency response. This novel temperature compensation method is very promising for RF-SAW device applications
Keywords :
compensation; elastic constants; lithium compounds; piezoelectric materials; surface acoustic wave devices; thermal expansion; thermal stresses; wafer bonding; LiNbO3; LiTaO3; RF-SAW device applications; SAW devices; direct bonding techniques; elastic constant; frequency response; glass substrate; low thermal expansion coefficient; piezoelectric substrate; temperature coefficient of frequency; temperature compensation method; thermal expansion; thermal strain; Bonding; Capacitive sensors; Glass; Piezoelectric devices; Piezoelectric films; Piezoelectric materials; Substrates; Surface acoustic wave devices; Temperature; Thermal expansion;
Conference_Titel :
Ultrasonics Symposium, 1997. Proceedings., 1997 IEEE
Conference_Location :
Toronto, Ont.
Print_ISBN :
0-7803-4153-8
DOI :
10.1109/ULTSYM.1997.663015