• DocumentCode
    3507849
  • Title

    Research on eutectic bonding processes and interfacial damage features in high power LED package

  • Author

    Liu, Wenxin ; Jin, Ping

  • Author_Institution
    Shenzhen Grad. Sch., Pking Univ., Shenzhen, China
  • fYear
    2012
  • fDate
    13-16 Aug. 2012
  • Firstpage
    1432
  • Lastpage
    1434
  • Abstract
    Metal bonding is the most promising die-attach process in high power LED package, which has lower thermal resistance and higher device reliability in comparison with the traditional insulation paste or silver paste die-attach processes. In this project, the eutectic bonding technology, flux-eutectic bonding technology and solder-bonding technology were studied, and the interfacial microstructure was observed and the failure features were revealed and analyzed. This study provided some basic date and a theoretical basis for the die-bonding processes and especially gives a direction for the LED packaging industry.
  • Keywords
    bonding processes; eutectic alloys; failure analysis; insulation; light emitting diodes; microassembling; semiconductor device packaging; semiconductor device reliability; solders; thermal resistance; LED packaging industry; device reliability; die-bonding processes; eutectic bonding processes; failure features; flux-eutectic bonding technology; high power LED package; interfacial damage features; interfacial microstructure; metal bonding; silver paste die-attach processes; solder-bonding technology; thermal resistance; traditional insulation paste; Abstracts; Educational institutions; Facsimile; Light emitting diodes; Packaging; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2012 13th International Conference on
  • Conference_Location
    Guilin
  • Print_ISBN
    978-1-4673-1682-8
  • Electronic_ISBN
    978-1-4673-1680-4
  • Type

    conf

  • DOI
    10.1109/ICEPT-HDP.2012.6474875
  • Filename
    6474875