Title :
Research on eutectic bonding processes and interfacial damage features in high power LED package
Author :
Liu, Wenxin ; Jin, Ping
Author_Institution :
Shenzhen Grad. Sch., Pking Univ., Shenzhen, China
Abstract :
Metal bonding is the most promising die-attach process in high power LED package, which has lower thermal resistance and higher device reliability in comparison with the traditional insulation paste or silver paste die-attach processes. In this project, the eutectic bonding technology, flux-eutectic bonding technology and solder-bonding technology were studied, and the interfacial microstructure was observed and the failure features were revealed and analyzed. This study provided some basic date and a theoretical basis for the die-bonding processes and especially gives a direction for the LED packaging industry.
Keywords :
bonding processes; eutectic alloys; failure analysis; insulation; light emitting diodes; microassembling; semiconductor device packaging; semiconductor device reliability; solders; thermal resistance; LED packaging industry; device reliability; die-bonding processes; eutectic bonding processes; failure features; flux-eutectic bonding technology; high power LED package; interfacial damage features; interfacial microstructure; metal bonding; silver paste die-attach processes; solder-bonding technology; thermal resistance; traditional insulation paste; Abstracts; Educational institutions; Facsimile; Light emitting diodes; Packaging; Substrates;
Conference_Titel :
Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2012 13th International Conference on
Conference_Location :
Guilin
Print_ISBN :
978-1-4673-1682-8
Electronic_ISBN :
978-1-4673-1680-4
DOI :
10.1109/ICEPT-HDP.2012.6474875