• DocumentCode
    3507933
  • Title

    A micrometric thickness silicon diode proposed as a microdosimeter

  • Author

    Fazzi, Alberto ; Agosteo, Stefano ; Pola, Andrea ; Varoli, Vincenzo ; Zotto, Pierluigi

  • Author_Institution
    Dept. of Nucl. Eng., Politecnico di Milano, Milan, Italy
  • Volume
    1
  • fYear
    2004
  • fDate
    16-22 Oct. 2004
  • Firstpage
    330
  • Abstract
    A thin silicon diode formed by a deep p+ implantation under a shallow n+ one is proposed as a solid state microdosimeter. The thickness of the sensitive volume of the tested device is about two micrometers and the active area is about ten millimeters square. Due to the very large electric capacitance of the diode (about 1 nF) a low noise read-out circuit based on a discrete JFET has been developed. The noise due to the parasitic resistance of the detector itself dominates and fixes the lower threshold of the energy spectrum. A prototype of the proposed microdosimeter covered with a polyethylene converter has been irradiated with fast monoenergetic neutrons at the INFN-Legnaro Labs (I). The first experimental spectra are in good agreement with the simulated ones. The effect of direct interactions of thermal neutrons in silicon has been measured.
  • Keywords
    capacitance; dosimeters; junction gate field effect transistors; neutron detection; nuclear electronics; readout electronics; semiconductor device noise; semiconductor diodes; silicon radiation detectors; diode electric capacitance; direct thermal neutron interactions; discrete JFET; energy spectrum; low noise read-out circuit; micrometric thickness silicon diode; monoenergetic neutrons; n+ implantation; p+ implantation; polyethylene converter; solid state microdosimeter; Circuit noise; Circuit testing; Diodes; Electric resistance; JFET circuits; Millimeter wave devices; Neutrons; Parasitic capacitance; Silicon; Solid state circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2004 IEEE
  • ISSN
    1082-3654
  • Print_ISBN
    0-7803-8700-7
  • Electronic_ISBN
    1082-3654
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2004.1462207
  • Filename
    1462207