• DocumentCode
    3508034
  • Title

    A Fault-Tolerance Cluster Head Based Routing Protocol for Ad Hoc Networks

  • Author

    Qin, Yang ; Pang, Kong Ling

  • Author_Institution
    Sch. of EEE, Nanyang Technol. Univ., Singapore
  • fYear
    2008
  • fDate
    11-14 May 2008
  • Firstpage
    2472
  • Lastpage
    2476
  • Abstract
    The hierarchical routing protocols have been proposed to deal with the path search in wireless multi hop networks in various research works. Most existing designs of ad hoc network routing protocols are based on the assumption of non-adversarial environment, that every node in the network is cooperative and well behaved. However, such assumption usually does not hold in realistic environments. The performance of current routing protocols degrades significantly when misbehaving nodes exist in the network. In this paper we introduce an efficient and effective hierarchical algorithm for MANET, which is called fault-tolerance cluster head based (FTCH) routing protocol. FTCH is proposed to provide a certain packet delivery fraction guarantee and low routing overhead in the presence of faulty nodes. The FTCH routing protocol is evaluated through both analysis and simulations compared with max-min multi-hop routing protocol (MMMH), AODV and DSR. The results show that FTCH greatly improves the ad hoc routing performance in the presence of misbehaving nodes.
  • Keywords
    ad hoc networks; fault tolerance; minimax techniques; mobile radio; routing protocols; telecommunication network reliability; telecommunication network topology; fault-tolerance cluster head based routing protocol; hierarchical routing protocol; max-min multihop routing protocol; mobile ad hoc network; wireless multihop network; Ad hoc networks; Analytical models; Clustering algorithms; Communication system traffic control; Degradation; Fault tolerance; Mobile ad hoc networks; Network topology; Routing protocols; Wireless networks;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vehicular Technology Conference, 2008. VTC Spring 2008. IEEE
  • Conference_Location
    Singapore
  • ISSN
    1550-2252
  • Print_ISBN
    978-1-4244-1644-8
  • Electronic_ISBN
    1550-2252
  • Type

    conf

  • DOI
    10.1109/VETECS.2008.545
  • Filename
    4526101