DocumentCode
3508299
Title
Stress analysis of LED bulb under thermal and humid environment
Author
Lili Liang ; Daoguo Yang ; Chao Huang ; Fengze Hou ; Hongyu Tang ; Miao Cai ; Zhen Zhang
Author_Institution
Guilin Univ. of Electron. Technol., Guilin, China
fYear
2012
fDate
13-16 Aug. 2012
Firstpage
1530
Lastpage
1534
Abstract
LED luminaires is wildly used in global. In the heat and wet condition, the LED bulb is easy to failure. But the thermal and humidity stress in it is seldom studied. In terms of LED devices, study on the thermal and humidity reliability was on the thermal or humidity diffusion simulation, as well as material thermal or wet expansion stress. Coupling of heat-moisture study is few. In this paper, finite element software is used to simulate the steady-state thermal distribution and thermal stress distribution of LED bulb. Also simulate the humidity diffusion of LED bulb stored under 60°C/60RH environment for 168h. Couple the temperature field and the wet field by Klapper Long equation and calculate the vapor pressure. The result proves that the stress generated by the vapor pressure is low but is still important. The thermal stress generated at the edge of substrate which is likely to cause poor contact. The vapor pressure generated at the edge of chip which is likely to cause chip crack or poor contract. That will lead to the lighting fade. Air tightness for the body and the shade of LED bulb is very important.
Keywords
finite element analysis; light emitting diodes; reliability; stress analysis; Klapper long equation; LED bulb stress analysis; LED devices; LED luminaires; finite element analysis; heat-moisture coupling; humid environment; humidity diffusion simulation; humidity reliability; steady-state thermal distribution; thermal diffusion simulation; thermal environment; thermal reliability; thermal stress; time 168 h; vapor pressure; Stress;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2012 13th International Conference on
Conference_Location
Guilin
Print_ISBN
978-1-4673-1682-8
Electronic_ISBN
978-1-4673-1680-4
Type
conf
DOI
10.1109/ICEPT-HDP.2012.6474898
Filename
6474898
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