DocumentCode
3508531
Title
High-frequency lamp simulator for testing electronic ballasts
Author
Chen, Nan ; Chung, Henry Shu-Hung
Author_Institution
Center for Power Electron., City Univ. of Hong Kong, Kowloon, China
fYear
2009
fDate
3-5 Nov. 2009
Firstpage
3524
Lastpage
3529
Abstract
A high-frequency lamp simulator for testing the startup and steady-state behaviors of electronic ballasts is presented. It can simulate the behaviors of a fluorescent lamp before, during and after ignition. The main power processing stage (PPS) of the simulator consists of a high-frequency series-resonant AC/DC converter. The electronic ballast under test is connected to the AC side of the PPS through an L-C-L filter. The equivalent input impedance on the AC side of the PPS is adjusted by controlling the magnitude of the voltage on the DC side of the converter, and phase difference between the voltage on the ac side of the converter and ballast output. It can be controlled to be very large to simulate the lamp behavior before ignition. When the simulator is used to simulate the behavior of a lamp after ignition, the output current of the ballast is controlled to be in phase with its output voltage, so that the equivalent input impedance on the Ac side of the simulator is resistive, simulating the high-frequency characteristic of a fluorescent lamp. A 24 W prototype that can simulate the behaviors of a T8 fluorescent lamp has been tested and evaluated. The experimental results are in close agreement with the theoretical predictions.
Keywords
electronic equipment testing; lamp accessories; L-C-L filter; T8 fluorescent lamp; fluorescent lamp; high frequency lamp simulator; lamp behavior; power 24 W; power processing stage; testing electronic ballasts; Analog-digital conversion; DC-DC power converters; Electronic ballasts; Electronic equipment testing; Filters; Fluorescent lamps; Ignition; Impedance; Steady-state; Voltage control;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics, 2009. IECON '09. 35th Annual Conference of IEEE
Conference_Location
Porto
ISSN
1553-572X
Print_ISBN
978-1-4244-4648-3
Electronic_ISBN
1553-572X
Type
conf
DOI
10.1109/IECON.2009.5415168
Filename
5415168
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