DocumentCode :
3508831
Title :
Semi-Synthetic Circuit Generation Using Graph Monomorphism for Testing Incremental Placement and Incremental Routing Tools
Author :
Grant, David ; Chin, Scott ; Lemieux, Guy
Author_Institution :
British Columbia Univ., Vancouver, BC
fYear :
2006
fDate :
28-30 Aug. 2006
Firstpage :
1
Lastpage :
4
Abstract :
FPGA architects are always searching for more benchmark circuits to stress CAD tools and device architectures. In this paper we present a new method to generate benchmark circuits by removing part of a real circuit and replacing it with a synthetic clone. This replacement or stitching process can easily introduce combinational loops if the synthetic circuit contains an input-to-output dependence that was not in the original subcircuit it is replacing. We show that this can be expressed as the graph monomorphism problem, and that a solution to that problem gives a precise stitching assignment that is cycle-free. This technique can be used to create new benchmark circuits that are identical to the original circuit except for small, local changes. The resulting semi-synthetic benchmarks are ideal for testing incremental place and route tools.
Keywords :
combinational circuits; graph theory; logic CAD; network routing; benchmark circuits; combinational loops; graph monomorphism; incremental placement; incremental routing tools; replacement process; semisynthetic circuit generation; stitching process; synthetic circuit; Benchmark testing; Character generation; Circuit testing; Cloning; Field programmable gate arrays; Logic; Routing; Stochastic processes; Stress; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Field Programmable Logic and Applications, 2006. FPL '06. International Conference on
Conference_Location :
Madrid
Print_ISBN :
1-4244-0312-X
Type :
conf
DOI :
10.1109/FPL.2006.311300
Filename :
4101062
Link To Document :
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