Title :
A hybrid fem-based method for aligning prone and supine images for image guided breast surgery
Author :
Han, Lianghao ; Hipwell, John ; Mertzanidou, Thomy ; Carter, Tim ; Modat, Marc ; Ourselin, Sebastien ; Hawkes, David
Author_Institution :
CMIC, Univ. Coll. London, London, UK
fDate :
March 30 2011-April 2 2011
Abstract :
In breast conserving surgery clinicians may benefit from information from preoperative images (e.g. high quality dynamic contrast enhanced magnetic resonant image obtained in the prone position), by registering them to the supine patient on the operating table in the theatre. Due to large deformation involved between prone and supine, either non-rigid intensity-based mage registration methods or biomechanical model based methods alone have limited success. In this paper, we proposed a hybrid finite element method (FEM) based image registration method by combining patient-specific biomechanical models with nonrigid intensity-based image registration methods. FEM-based biomechanical models were used to estimate the major deformation of breasts while non-rigid intensity based image registration methods were used to recover the difference between experimental acquisitions and FE predictions due to the simplifications and approximations of biomechanical models. The proposed method shows a good performance for image registration, demonstrated by the experimental example of prone and supine MR breast image registration.
Keywords :
biomedical MRI; finite element analysis; image registration; medical image processing; surgery; biomechanical model based method; breast conserving surgery; finite element method; image guided breast surgery; intensity-based mage registration; prone image aligning; supine image aligning; Biological system modeling; Biomedical imaging; Breast; Deformable models; Finite element methods; Image registration; Materials; Breast; Finite element method; Image registration; Image-guided surgery; Magnetic resonant;
Conference_Titel :
Biomedical Imaging: From Nano to Macro, 2011 IEEE International Symposium on
Conference_Location :
Chicago, IL
Print_ISBN :
978-1-4244-4127-3
Electronic_ISBN :
1945-7928
DOI :
10.1109/ISBI.2011.5872626