• DocumentCode
    3509043
  • Title

    Cost at Risk in R&D Project Risk Management

  • Author

    Yin, Na ; Li, Jinlin

  • Author_Institution
    Beijing Inst. of Technol., Beijing
  • fYear
    2007
  • fDate
    21-25 Sept. 2007
  • Firstpage
    5184
  • Lastpage
    5187
  • Abstract
    The most popular tool used in the industry for project management is the earned value management (EVM). The major disadvantage of EVM is that it is a post-event method, and not very efficient in forecasting the exceeding cost during the project. In order to make EVM more efficient in pre-event exceeding cost risk recognition, the proportion of earned value over the budget has been suggested. The formula presented in Reference [10] has been modified in this paper, the example results show the modified formula´s simplicity when underlying forecast during the project. The significant difference has been found out between normal distribution and beta distribution, it is further requested to improve this model by the selection of p and q .
  • Keywords
    normal distribution; project management; research and development management; risk management; R&D project risk management; beta distribution; cost risk recognition; earned value management; normal distribution; post-event method; Costs; Gaussian distribution; Particle measurements; Project management; Research and development; Research and development management; Resource management; Risk management; Technology management; Uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Wireless Communications, Networking and Mobile Computing, 2007. WiCom 2007. International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-1311-9
  • Type

    conf

  • DOI
    10.1109/WICOM.2007.1269
  • Filename
    4341044