Title :
Power factor improvement of synchronous reluctance motors (SynRM) using permanent magnets for drive size reduction
Author :
Vartanian, Robert ; Toliyat, Hamid A. ; Akin, Bilal ; Poley, Richard
Author_Institution :
Adv. Electr. Machines & Power Electron. Lab., Texas A&M Univ., College Station, TX, USA
Abstract :
The performance of a synchronous reluctance motor (SynRM) depends on the direct-axis inductance (Ld) and the quadrature-axis inductance (Lq) of the machine. Increasing the saliency ratio Ld/Lq and making the difference between these inductances (Ld-Lq) large are well known methods for achieving high torque density and power factor. Placing the right amount of permanent magnets inside the rotor in the proper position will significantly improve the performance of this permanent magnet-assisted SynRM (PMa-SynRM). The PMa-SynRM offers higher power factor, which will reduce the size of the inverter. This study investigates the effect of Ferrite and NdFeBr permanent magnets on a 1.5kW SynRM, which has the capability of holding block shape magnets inside one of the rotor air barriers. Analytical analysis and finite element analysis (FEA) are used to compare the use of Ferrite against NdFeBr. Finally, the effects that using high or low cost magnets have on machine power factor and output performance have been studied.
Keywords :
beryllium alloys; ferrites; finite element analysis; invertors; iron alloys; neodymium alloys; permanent magnet motors; permanent magnets; power factor correction; reluctance motor drives; rotors; NdFeBr; NdFeBr permanent magnets; PMa-SynRM; analytical analysis; direct-axis inductance; drive size reduction; ferrite permanent magnets; finite element analysis; inverter; power 1.5 kW; power factor improvement; quadrature-axis inductance; rotor air barriers; synchronous reluctance motors; Magnetic cores; Magnetic flux; Permanent magnets; Reactive power; Rotors; Saturation magnetization; Torque;
Conference_Titel :
Applied Power Electronics Conference and Exposition (APEC), 2012 Twenty-Seventh Annual IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4577-1215-9
Electronic_ISBN :
978-1-4577-1214-2
DOI :
10.1109/APEC.2012.6165884