DocumentCode :
3509293
Title :
Stacked PMOS clamps for high voltage power supply protection
Author :
Maloney, Timothy J. ; Kan, Wilson
Author_Institution :
Intel Corp., Santa Clara, CA, USA
fYear :
1999
fDate :
28-30 Sept. 1999
Firstpage :
70
Lastpage :
77
Abstract :
Large PMOS FETs with multiple gates can be arranged to provide ESD protection to high voltage on-chip power supplies in submicron CMOS integrated circuits. These clamps divide the supply voltage among several gate oxides; the circuitry accompanying the large series FETs provides near-maximum gate drive during ESD for high pulsed current. Layouts are densely packed because minimum dimensions can be used and because no contact is needed between the stacked gates. The high voltage designs are extensions of the large PMOS FET ESD clamps and timed drive circuitry that are used to clamp ordinary on-chip power supply lines.
Keywords :
CMOS integrated circuits; MOSFET; dielectric thin films; driver circuits; electrostatic discharge; integrated circuit layout; power supply circuits; protection; CMOS integrated circuits; ESD; ESD protection; PMOS FET ESD clamps; SiO/sub 2/-Si; densely packed layouts; gate oxides; high voltage design; high voltage on-chip power supplies; multiple gate PMOS FETs; near-maximum gate drive; on-chip power supply line clamping; pulsed current; series FETs; stacked PMOS clamps; stacked gates; supply voltage division; timed drive circuitry; Circuits; Clamps; Diodes; Electrostatic discharge; Electrostatic interference; FETs; Power engineering and energy; Power supplies; Protection; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium Proceedings, 1999
Conference_Location :
Orlando, FL, USA
Print_ISBN :
1-58637-007-X
Type :
conf
DOI :
10.1109/EOSESD.1999.818992
Filename :
818992
Link To Document :
بازگشت