Title :
New analytical method for hysteresis modelling of soft magnetic materials using LabVIEW program
Author :
Motoasca, Septimiu ; Nicolaide, Andrei ; Helerea, Elena ; Scutaru, Gheorghe
Author_Institution :
Dept. of Electr. Eng., Transilvania Univ. of Brasov, Brasov, Romania
Abstract :
The paper deals with an analytical model for hysteresis cycle representation. The hysteresis curve is decomposed in a series of arcs of circles and segments of lines. Each arc of circle or segment of line is expressed using analytical geometry as a function of some given parameters or calculated ones. The easiness of the model proposed is given by the small amount of input data needed to represent the hysteresis cycle in a satisfactory way. Using an inverse mapping function from major hysteresis branches the minor cycles, reversal curve of the first kind or curve of first magnetization can be obtained. Finally a comparison between the measured data and modelled ones was made. The analytical model was implemented with LabVIEW program using Data Acquisition Board driven. The LabVIEW programs for measurement system and analytical model can be coupled in an extended program. In this way the time for the measurements can be reduced only at the time necessary to obtain the major hysteresis loop, and the analytical model can made the rest of the characteristics needed - reversal curve of the first kind or minor hysteresis cycles.
Keywords :
magnetic hysteresis; soft magnetic materials; Data Acquisition Board driven; Lab VIEW program; analytical geometry; analytical model; hysteresis curve; hysteresis cycle representation; hysteresis loop; hysteresis modelling; inverse mapping function; magnetization; reversal curve; soft magnetic materials; Analytical models; Electronic mail; Geometry; Hydrogen; Magnetic analysis; Magnetic fields; Magnetic hysteresis; Magnetic materials; Magnetization; Soft magnetic materials; LabVIEW program; hysteresis modelling; magnetic materials;
Conference_Titel :
Industrial Electronics, 2009. IECON '09. 35th Annual Conference of IEEE
Conference_Location :
Porto
Print_ISBN :
978-1-4244-4648-3
Electronic_ISBN :
1553-572X
DOI :
10.1109/IECON.2009.5415201