DocumentCode :
3509434
Title :
Measurement of ionizer performance-a new approach
Author :
Levit, Larry B. ; Desai, Gaurisha Gajjar ; Vosteen, William
Author_Institution :
Technol. Dev., Ion Syst. Inc., Berkeley, CA, USA
fYear :
1999
fDate :
28-30 Sept. 1999
Firstpage :
124
Lastpage :
129
Abstract :
The ANSI/EOS/ESDS 3.1-1991 standard utilizes a charge plate monitor (CPM) to measure ionizer performance. The CPM measures positive and negative discharge times (DT+ and DT-) and offset voltage on a 200 mm/spl times/200 mm plate, not on real parts. While the CPM produces consistent measurements that are a good metric for ionizer performance, it is not necessarily the best way to measure ionizer performance on other objects. This paper analyzes an instrument and a protocol that produces measurements that correlate with CPM balance and discharge times and represent physical quantities which can project to the response of various objects in the manufacturing line. These parameters are air resistance and offset voltage. The study shows that the ionized air acts as an ohmic medium. The instrument under study, a biased plate monitor (BPM) is a biased HV plate with a nano-ammeter to measure the ion current it intercepts. The calculated discharge time from BPM as compared with the CPM measurement is excellent (<10%). The biased plate monitor (BPM) has the advantage that its readout is immediate and does not require a wait to obtain the discharge time. The biased plate also can record the offset voltage. Measurements were made over the range of 0 to 70 V of offset and compared with a CPM measurement. The results showed excellent matching.
Keywords :
ammeters; electrostatic discharge; integrated circuit reliability; integrated circuit yield; ionisation; process monitoring; test equipment; 0 to 70 V; 200 mm; ANSI/EOS/ESDS 3.1-1991 standard; CPM balance; CPM discharge times; ESD control; air resistance; biased HV plate; biased plate monitor; biased plate monitor readout; charge plate monitor; discharge time; ion current; ionized air ohmic medium action; ionizer performance; ionizer performance measurement; manufacturing line object response; measurement instrument; nano-ammeter; negative discharge time; offset voltage; positive discharge time; protocol; ANSI standards; Current measurement; Earth Observing System; Electrical resistance measurement; Electrostatic discharge; Instruments; Measurement standards; Monitoring; Performance evaluation; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium Proceedings, 1999
Conference_Location :
Orlando, FL, USA
Print_ISBN :
1-58637-007-X
Type :
conf
DOI :
10.1109/EOSESD.1999.818998
Filename :
818998
Link To Document :
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