Title :
Comparison of dynamic load modeling using neural network and traditional method
Author :
Ren-mu, He ; Germond, Alain J.
Author_Institution :
North China Inst. of Electric Power, Beijing, China
Abstract :
The representation of load dynamic characteristics remains an area of great uncertainty and it becomes a limiting factor of power systems dynamic performance analysis. A major difficulty, both for component-based and measurement-based methods, is the lack of data for dynamic load modeling. A way of solving this problem for measurement-based methods is to interpolate and extrapolate the models identified from wide voltage variation data recorded during naturally-occurring disturbances or field experiments. This paper deals with data measured in Chinese power systems using two models: a multilayer feedforward neural network (ANN) with backpropagation learning, and difference equations (DE) with recursive extended least square identification. A comparison between the two approaches was done. The results show that the DE models interpolation and extrapolation are nearly linear, and they cannot describe the voltage-power nonlinear relationship of load dynamic characteristics. However, the ANN models can represent well this nonlinear relationship, they are promising dynamic load models.
Keywords :
backpropagation; difference equations; feedforward neural nets; load forecasting; power systems; China; backpropagation learning; difference equations; disturbances; dynamic characteristics; dynamic load modeling; extrapolation; field experiments; interpolation; load forecasting; multilayer feedforward neural network; performance analysis; power systems; recursive extended least square identification; Artificial neural networks; Load modeling; Multi-layer neural network; Neural networks; Performance analysis; Power measurement; Power system dynamics; Power system measurements; Power system modeling; Voltage;
Conference_Titel :
Neural Networks to Power Systems, 1993. ANNPS '93., Proceedings of the Second International Forum on Applications of
Conference_Location :
Yokohama, Japan
Print_ISBN :
0-7803-1217-1
DOI :
10.1109/ANN.1993.264338