Title :
Simulation verification and evaluation of radar BIT system based on multi-signal model
Author :
Xue, Jia ; Cai, Jinyan ; Zhang, Hong
Author_Institution :
Dept. of Opt. & Electron. Eng., Ordnance Eng. Coll., Shijiazhuang, China
Abstract :
By utilizing the multi-signal model, the simulation-based BIT testability verification and evaluation has lower cost and requires less time than traditional methods, which has lower risk accordingly. The intelligent diagnosis system based on this method integrates the system modeling, testability analysis, diagnosis and presentation, which not only helps to testify the BIT quantitatively, but also helps to improve BIT maturity. Finally the system is applied to a radar assembly for BIT testability verification and evaluation.
Keywords :
built-in self test; radar signal processing; built-in-test verification system; intelligent diagnosis system; multisignal model; radar BIT system; Costs; Electronic equipment testing; Fault detection; Fault diagnosis; Laser radar; Modeling; Relays; Signal analysis; Spaceborne radar; System testing; multi-signal model; radar BIT; simulation verification and evaluation; testability modeling;
Conference_Titel :
Reliability, Maintainability and Safety, 2009. ICRMS 2009. 8th International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-4903-3
Electronic_ISBN :
978-1-4244-4905-7
DOI :
10.1109/ICRMS.2009.5269960
