DocumentCode
3509803
Title
Electrostatic discharge (ESD) mechanism for battery charge contact failure in cordless phones
Author
Coyle, Richard J. ; Jon, Min-Chung
Author_Institution
AT&T Bell Labs., Princeton, NJ, USA
fYear
1999
fDate
28-30 Sept. 1999
Firstpage
287
Lastpage
292
Abstract
A comparison of the SEM EDX spectra for the metal charge contacts from field-returned cordless phones and for laboratory samples of fixed gap discharge (FGD) tests reveals similar chemical elements, suggesting that electrostatic discharge (ESD) is the possible source for cordless phone field failure.
Keywords
X-ray chemical analysis; cellular radio; electrical contacts; electronic equipment testing; electrostatic discharge; failure analysis; scanning electron microscopy; ESD mechanism; FGD tests; SEM EDX spectra; battery charge contact failure; chemical elements; cordless phone field failure; cordless phones; electrostatic discharge; field-returned cordless phones; fixed gap discharge tests; laboratory samples; metal charge contacts; Batteries; Chemicals; Circuits; Contacts; Electrons; Electrostatic discharge; Failure analysis; Insulation; Laboratories; Solids;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Overstress/Electrostatic Discharge Symposium Proceedings, 1999
Conference_Location
Orlando, FL, USA
Print_ISBN
1-58637-007-X
Type
conf
DOI
10.1109/EOSESD.1999.819073
Filename
819073
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