Title :
Electrostatic discharge (ESD) mechanism for battery charge contact failure in cordless phones
Author :
Coyle, Richard J. ; Jon, Min-Chung
Author_Institution :
AT&T Bell Labs., Princeton, NJ, USA
Abstract :
A comparison of the SEM EDX spectra for the metal charge contacts from field-returned cordless phones and for laboratory samples of fixed gap discharge (FGD) tests reveals similar chemical elements, suggesting that electrostatic discharge (ESD) is the possible source for cordless phone field failure.
Keywords :
X-ray chemical analysis; cellular radio; electrical contacts; electronic equipment testing; electrostatic discharge; failure analysis; scanning electron microscopy; ESD mechanism; FGD tests; SEM EDX spectra; battery charge contact failure; chemical elements; cordless phone field failure; cordless phones; electrostatic discharge; field-returned cordless phones; fixed gap discharge tests; laboratory samples; metal charge contacts; Batteries; Chemicals; Circuits; Contacts; Electrons; Electrostatic discharge; Failure analysis; Insulation; Laboratories; Solids;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium Proceedings, 1999
Conference_Location :
Orlando, FL, USA
Print_ISBN :
1-58637-007-X
DOI :
10.1109/EOSESD.1999.819073
