ESD testing of head stack assemblies used in magnetic recording hard disk drives

Author

Wallash, Albert

Author_Institution

Quantum Corp., Milpitas, CA, USA

fYear

1999

fDate

28-30 Sept. 1999

Firstpage

297

Lastpage

301

Abstract

ESD testing of the head stack assembly (HSA) used in hard disk drives is described. Testing using an IEC 801-2 simulator as well as a field induced model are described. Results show that giant magnetoresistive (GMR) heads can be magnetically damaged at voltages as low as 150 V using an ESD gun. GMR heads on an HSA can be damaged magnetically and their resistance can be increased, in spite of the fact that the preamplifier is between the GMR heads and the connector. It is concluded that it is important and interesting to conduct ESD testing of head stack assembles and that some HSA designs may require some degree of ESD control in a manufacturing environment if ESD damage is to be avoided.

Keywords

IEC standards; disc drives; electric fields; electronic equipment testing; giant magnetoresistance; magnetic heads; magnetic recording; magnetoresistive devices; preamplifiers; reliability; ESD control; ESD damage; ESD gun; ESD testing; GMR heads; HSA designs; IEC 801-2 simulator; connector; field induced model; giant magnetoresistive heads; hard disk drives; head stack assemblies; head stack assembly; magnetic damage; magnetic recording hard disk drives; manufacturing environment; preamplifier; resistance; Assembly; Electrostatic discharge; Giant magnetoresistance; Hard disks; IEC standards; Low voltage; Magnetic heads; Magnetic recording; Preamplifiers; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Overstress/Electrostatic Discharge Symposium Proceedings, 1999

Conference_Location

Orlando, FL, USA

Print_ISBN

1-58637-007-X

Type

conf

DOI

10.1109/EOSESD.1999.819075

Filename

819075