• DocumentCode
    3509870
  • Title

    A unified approach to expectation-maximization and level set segmentation applied to stem cell and brain MRI images

  • Author

    Lowry, Nathan ; Mangoubi, Rami ; Desai, Mukund ; Marzouk, Youssef ; Sammak, Paul

  • Author_Institution
    Massachusetts Inst. of Technol., Cambridge, MA, USA
  • fYear
    2011
  • fDate
    March 30 2011-April 2 2011
  • Firstpage
    1446
  • Lastpage
    1450
  • Abstract
    We present a unified approach to Expectation-Maximization (EM) and Level Set image segmentation that combines the advantages of the two algorithms via a geometric prior that encourages local classification similarity. Compared to level sets, our method increases the information returned by providing probabilistic soft decisions, is easily extensible to multiple regions, and does not require solving Partial Differential Equations (PDEs). Relative to the basic mixture model EM, the unified algorithm improves robustness to noise while smoothing class transitions. We illustrate the versatility and advantages of the algorithm on two real-life problems: segmentation of induced pluripotent stem cell (iPSC) colonies in phase contrast microscopic images and information recovery from brain magnetic resonance images (MRI).
  • Keywords
    biomedical MRI; brain; cellular biophysics; expectation-maximisation algorithm; image classification; image segmentation; medical image processing; brain MRI images; brain magnetic resonance images; expectation-maximization method; image classification; information recovery; level-set image segmentation algorithm; phase contrast microscopic images; pluripotent stem cell colonies; stem cell images; Equations; Image segmentation; Level set; Magnetic resonance imaging; Noise; Phantoms; Stem cells; ESC; Expectation-Maximization (EM); brain MRI; iPSC; level set; segmentation; stem cell;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biomedical Imaging: From Nano to Macro, 2011 IEEE International Symposium on
  • Conference_Location
    Chicago, IL
  • ISSN
    1945-7928
  • Print_ISBN
    978-1-4244-4127-3
  • Electronic_ISBN
    1945-7928
  • Type

    conf

  • DOI
    10.1109/ISBI.2011.5872672
  • Filename
    5872672