DocumentCode :
3509893
Title :
High efficiency current mode control for three-phase micro-inverters
Author :
Zhang, Dehua ; Zhang, Qian ; Hu, Haibing ; Grishina, Anna ; Shen, John ; Batarseh, Issa
Author_Institution :
Coll. of Electr. & Eng., Zhejiang Univ., Hangzhou, China
fYear :
2012
fDate :
5-9 Feb. 2012
Firstpage :
892
Lastpage :
897
Abstract :
Three-phase micro-inverters are critical to the success of AC modules in Mega Watt PV farms. A high performance micro-inverter must have high power density, high reliability, and low cost. Boundary Current Mode (BCM), Variable Hysteresis Current Mode (VHCM), and Constant Hysteresis Current Mode (CHCM) are derived from a proposed softswitching current mode control scheme which is based on the general half-bridge three-phase inverter topology. The frequency range and switch losses are compared and discussed. The VHCM has the highest efficiency at over 97.6%, while the CHCM has the narrowest frequency range. A hybrid control platform combining analog and logic units with DSP was designed and built to achieve the high-speed peak current control. A high frequency, high efficiency, and high power density micro-inverter was built for experimentation. The experimental results verify that the proposed control scheme is a promising solution for high performance three-phase micro-inverters.
Keywords :
digital signal processing chips; electric current control; invertors; photovoltaic power systems; reliability; zero current switching; zero voltage switching; AC modules; DSP; analog units; boundary current mode; constant hysteresis current mode; current mode control; half-bridge three-phase inverter topology; hybrid control; logic units; mega watt PV farms; power density; reliability; soft switching; three-phase microinverters; variable hysteresis current mode; Bridge circuits; Current control; Hysteresis; Inductors; Inverters; MOSFETs; Switches;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applied Power Electronics Conference and Exposition (APEC), 2012 Twenty-Seventh Annual IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4577-1215-9
Electronic_ISBN :
978-1-4577-1214-2
Type :
conf
DOI :
10.1109/APEC.2012.6165924
Filename :
6165924
Link To Document :
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