DocumentCode :
3509994
Title :
An improved model of man for ESD applications
Author :
Amoruso, V. ; Helali, Mohamed ; Lattarulo, Francesco
Author_Institution :
Dipt. di Elettrotecnica ed Elettronica, Politecnico di Bari, Italy
fYear :
1999
fDate :
28-30 Sept. 1999
Firstpage :
335
Lastpage :
343
Abstract :
Human-generated ESD current waveshapes are predicted under contact discharge and arc discharge conditions. The uncertainties connected to the man´s posture and proximity to the victim element are carefully examined. The adopted human body model is devised to be composed of 11 elemental blocks and treated by the diakoptic method in analogy with network theory. The set of given leakage capacitances, in conjunction with the resistances and inductances as serial parameters, forms a complex RLC network. The assembly includes the grounded or ungrounded victim element and image elements due to the presence of the plane and a nearby vertical wall. PSPICE software allows the discharge scenario to be evaluated. New insight into the complex charge transfer is thus gained, which has been combined with arc derived performances. This careful analytical interpretation of the ESD phenomenon could contribute to in-progress standardization.
Keywords :
SPICE; arcs (electric); capacitance; electric resistance; electrostatic discharge; inductance; network topology; software tools; ESD applications; ESD phenomenon; PSPICE software; arc derived performance; arc discharge; charge transfer; complex RLC network; contact discharge; diakoptic method; discharge scenario; grounded victim element; human body model; human posture; human proximity; human-generated ESD current waveshapes; image elements; in-progress standardization; inductances; leakage capacitances; network theory; resistances; serial parameters; ungrounded victim element; victim element; Arc discharges; Assembly; Biological system modeling; Capacitance; Charge transfer; Diakoptics; Electrostatic discharge; Humans; SPICE; Uncertainty;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium Proceedings, 1999
Conference_Location :
Orlando, FL, USA
Print_ISBN :
1-58637-007-X
Type :
conf
DOI :
10.1109/EOSESD.1999.819081
Filename :
819081
Link To Document :
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