DocumentCode :
3510019
Title :
Hardware/firmware co-design in an 8-bits microcontroller to solve the system-level ESD issue on keyboard
Author :
Ker, Ming-Dou ; Sung, Yu-Yu
Author_Institution :
Comput. & Commun. Res. Lab., Ind. Technol. Res. Inst., Hsinchu, Taiwan
fYear :
1999
fDate :
28-30 Sept. 1999
Firstpage :
352
Lastpage :
360
Abstract :
A hardware/firmware co-design solution in an 8-bit microcontroller has been proposed to practically fix the system-level ESD (electrostatic discharge) issue on keyboard products. By including special ESD sensors and an additional ESD flag into the chip, the fast electrical transient due to the system-level ESD zapping on the keyboard can be detected. The firmware stored in the ROM of the 8-bit microcontroller is designed to automatically check the ESD flag to monitor abnormal conditions in system operations. If the keyboard is upset or locked up by a system-level ESD transient, the microcontroller can be quickly recovered to a known and stable state. The 8-bit microcontroller with the hardware/firmware co-design solution has been fabricated in a 0.45 /spl mu/m CMOS process. The system-level ESD susceptibility of the keyboard with this 8-bit microcontroller has been improved from the original 2 kV (4 kV) to greater than 8 kV (15 kV) for contact-discharge (air-discharge) ESD zapping.
Keywords :
CMOS digital integrated circuits; electric sensing devices; electrostatic discharge; firmware; hardware-software codesign; integrated circuit design; keyboards; microcontrollers; monitoring; read-only storage; 0.45 micron; 15 kV; 2 kV; 4 kV; 8 bit; 8 kV; CMOS process; ESD flag; ESD sensors; abnormal condition monitoring; air discharge; contact discharge; electrical transient; electrostatic discharge; firmware; hardware/firmware co-design; keyboard; keyboard products; keyboard system-level ESD susceptibility; microcontroller; microcontroller ROM; microcontroller recovery; stable state; system operations; system-level ESD; system-level ESD transient; CMOS process; Computerized monitoring; Condition monitoring; Electrostatic discharge; Hardware; Keyboards; Microcontrollers; Microprogramming; Read only memory; Sensor systems;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium Proceedings, 1999
Conference_Location :
Orlando, FL, USA
Print_ISBN :
1-58637-007-X
Type :
conf
DOI :
10.1109/EOSESD.1999.819083
Filename :
819083
Link To Document :
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