DocumentCode
3510228
Title
Iterative image reconstruction for dual-energy X-ray CT using regularized material sinogram estimates
Author
Huh, Wonseok ; Fessler, Jeffrey A.
Author_Institution
Dept. of Electr. Eng. & Comput. Sci., Univ. of Michigan, Ann Arbor, MI, USA
fYear
2011
fDate
March 30 2011-April 2 2011
Firstpage
1512
Lastpage
1515
Abstract
X-ray CT images have various applications, including CT-based attenuation correction (CTAC) for PET. Low-dose CT imaging is particularly desirable for CTAC. Dual-energy (DE) CT imaging methods may improve the accuracy of attenuation correction in PET. However, conventional DE CT approaches to sinogram material decomposition use logarithmic transforms that are sensitive to noise in low-dose scans. This paper describes a DE reconstruction method based on statistical models that avoids using a logarithm. We first estimate material sinograms directly from the raw DE data (without any logarithm), with mild regularization to control noise and avoid outliers. We then apply a penalized weighted least squares (PWLS) method to reconstruct images of the two material components. We also propose a joint edge-preserving regularizer that uses the prior knowledge that the two material images have many region edges located in the same positions. Preliminary simulation results suggest that this iterative method improves image quality compared to conventional approaches based on log data for low-dose DE CT scans.
Keywords
computerised tomography; data analysis; diagnostic radiography; edge detection; image reconstruction; iterative methods; least squares approximations; medical image processing; positron emission tomography; statistical analysis; PET; data analysis; dual-energy CT-based attenuation correction; dual-energy X-ray CT; image noise; iterative image reconstruction; joint edge-preserving regularizer; mild regularization; penalized weighted least square method; regularized material sinogram estimates; statistical models; Biological tissues; Bones; Computed tomography; Image reconstruction; Materials; Noise; X-ray imaging;
fLanguage
English
Publisher
ieee
Conference_Titel
Biomedical Imaging: From Nano to Macro, 2011 IEEE International Symposium on
Conference_Location
Chicago, IL
ISSN
1945-7928
Print_ISBN
978-1-4244-4127-3
Electronic_ISBN
1945-7928
Type
conf
DOI
10.1109/ISBI.2011.5872688
Filename
5872688
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