A crystal spectrograph and its application in plasma focus

Author

Zhang, G.X. ; Liu, M.H. ; Lee, Sang-Rim ; Lee, P.

Author_Institution

Tsinghua Univ., Beijing, China

fYear

2004

fDate

1-1 July 2004

Firstpage

395

Abstract

Summary form only given. A compact crystal spectrograph for soft X-ray measurement in a plasma focus facility was designed and studied. The spectrograph has an adjustment system with 5 degrees of freedom making it easy to align and use. The spectrography provided spatial resolved spectrum in one dimension over 0.1-5 nm wavelength range. A TIAP crystal with different form (flat and curve) was used to obtain spatial resolve spectra of Ne and Ar ion from DPF plasma focus. Such a spectrograph is also suitable to be used coupled to soft streak camera or X-ray CCD detector.

Keywords

CCD image sensors; X-ray detection; argon; neon; plasma diagnostics; plasma focus; streak cameras; 0.1 to 5 nm; Ar; DPF plasma focus; Ne; TIAP crystal; X-ray CCD detector; compact crystal spectrograph; degrees of freedom; soft X-ray measurement; soft streak camera; spatial resolved spectrum; Argon; Charge coupled devices; Charge-coupled image sensors; Plasma applications; Plasma measurements; Plasma waves; Plasma x-ray sources; Spatial resolution; Wavelength measurement; X-ray detection;

fLanguage

English

Publisher

ieee

Conference_Titel

Plasma Science, 2004. ICOPS 2004. IEEE Conference Record - Abstracts. The 31st IEEE International Conference on

Conference_Location

Baltimore, MD, USA

ISSN

0730-9244

Print_ISBN

0-7803-8334-6

Type

conf

DOI

10.1109/PLASMA.2004.1340162

Filename

1340162