Characterization of a time resolved diagnostic for measuring source spot size

Summary form only given. As part of a continuous research effort into the development of high brightness flash radiographic sources, Sandia National Laboratories is developing a suite of advanced diagnostics that will aid in the characterization of these high-intensity electron-beam diodes. There are various time dependent beam transport features that inhibit the stable operation of these sources. A scintillator based time resolved spot size diagnostic (TRSD) was developed to quantify these beam variations. Preliminary results demonstrated beam centroid tracking as well as time dependent beam spot size measurements. Detailed characterization of the TRSD, including an assessment of the temporal and spatial resolution of the system is underway. Results of these tests as well the improvements and modifications being incorporated into a 2nd generation TRSD design are detailed in this paper.