Title :
Time-of-flight measurement as a tool to investigate the hole blocking nature of an operating organic light-emitting diode
Author :
Rahman, Md Mamunur ; Ogawa, Naoko ; Noguchi, Y. ; Ishii, Hiroyuki ; Nakayama, Yoshinori ; Ishii, Hiroyuki
Author_Institution :
Grad. Sch. of Adv. Integration Sci., Chiba Univ., Chiba, Japan
Abstract :
For better understanding the operation of organic electronic devices, the information of carrier behavior is indispensable. In this study, we propose a new usage of time-off-light (TOF) technique to examine the carrier behavior in operating device. From the measurement for ITO|α-NPD|Alq3|Al device, which is a widely investigated organic light emitting diode, we have demonstrated the feasibility of TOF measurement for double-layer device in operating condition. The obtained TOF signal includes two kinds of useful information: (i) carrier transporting nature under the influence of actual current flow and (ii) delayed-transport and blocking of carriers at hetero interface.
Keywords :
aluminium; aluminium compounds; hole mobility; indium compounds; organic light emitting diodes; organic semiconductors; time of flight spectra; tin compounds; ITO-α-NPD-Alq3-Al device; ITO-Al; TOF signals; carrier behavior; carrier blocking; carrier transport; current flow; delayed-transport; double-layer device; heterointerface; hole blocking; operating condition; operating organic light-emitting diode; organic electronic devices; time-of-flight measurement; Current measurement; Extraterrestrial measurements; Indium tin oxide; Organic light emitting diodes; carrier behavior; hole blocking; organic light emitting diode; time of flight;
Conference_Titel :
Informatics, Electronics & Vision (ICIEV), 2012 International Conference on
Conference_Location :
Dhaka
Print_ISBN :
978-1-4673-1153-3
DOI :
10.1109/ICIEV.2012.6317499
