SLD constant-stress ADT data analysis based on time series method

Constant Stress Accelerated Degradation Testing (CSADT) is commonly used to evaluate the lifetime of long lifetime and high reliable products, such as Super Luminescent Diode (SLD). Previous works on CSADT use deterministic function to describe the product degradation and they are not considered adequately. This paper proposes a CSADT data analysis method based on time series method. It proposes a time series modeling procedure to model product performance degradation data. An example of SLD CASDT is given as an application of the modeling technique and the estimation method is presented.