DocumentCode :
3511286
Title :
Advanced thermal processing of semiconductor materials in the msec-range
Author :
Skorupa, W. ; Yankov, R.A. ; Voelskow, M. ; Anwand, W. ; Panknin, D. ; McMahon, R.A. ; Smith, M. ; Gebel, T. ; Rebohle, L. ; Fendler, R. ; Hentsch, W.
Author_Institution :
Inst. of Ion Beam Phys. & Mater. Res., Dresden
fYear :
2005
fDate :
4-7 Oct. 2005
Abstract :
This paper reviews the advances that flash lamp annealing brings to the processing of the most frequently used semiconductor materials, namely silicon and silicon carbide, thus enabling the fabrication of novel microelectronic structures and materials. The paper describes how such developments can translate into important practical applications leading to a wide range of technological benefits. Opportunities in ultra-shallow junction formation, heteroepitaxial growth of thin films of cubic silicon carbide on silicon, and crystallization of amorphous silicon films, along with the technical reasons for using flash lamp annealing are discussed in the context of state-of-the-art materials processing
Keywords :
amorphous semiconductors; crystallisation; elemental semiconductors; epitaxial growth; incoherent light annealing; nanotechnology; rapid thermal annealing; semiconductor epitaxial layers; semiconductor growth; silicon; silicon compounds; Si; SiC; amorphous silicon films; crystallization; cubic silicon carbide; flash lamp annealing; heteroepitaxial growth; microelectronic structures; msec-range thermal processing; semiconductor materials; thin films; ultra-shallow junction formation; Annealing; Crystalline materials; Crystallization; Fabrication; Lamps; Microelectronics; Paper technology; Semiconductor materials; Semiconductor thin films; Silicon carbide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Thermal Processing of Semiconductors, 2005. RTP 2005. 13th IEEE International Conference on
Conference_Location :
Santa Barbara, CA
Print_ISBN :
0-7803-9223-X
Type :
conf
DOI :
10.1109/RTP.2005.1613684
Filename :
1613684
Link To Document :
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