Nondestructive measurement of dielectric materials using photocharge voltage

Author

Park, Mam-Chun ; Min, Won-Gi ; Lee, Kuhn-Il

Author_Institution

Kyungnam Univ., Masan, South Korea

Volume

2

fYear

1997

fDate

25 -30 May 1997

Firstpage

952

Abstract

The photocharge voltage is observed for dielectric materials. This voltage appears on any solid body when light is irradiated on a sample. The potential difference is observed on various materials such as conductors, semiconductors, dielectrics, and ceramics. For dielectric materials, the magnitude of the voltage is of the order of μV. The purpose of this paper is to report the purely experimental photocharge voltage measurements for dielectric materials, including two dimensional scan of LiNbO₃ wafer, and the test structure. The photocharge voltage was generated by chopped laser and halogen lamp light

Keywords

dielectric measurement; laser beam effects; nondestructive testing; voltage measurement; LiNbO₃; chopped laser; dielectric materials; halogen lamp light; nondestructive measurement; photocharge voltage; test structure; two dimensional scan; Aluminum; Conducting materials; Dielectric materials; Dielectric measurements; Light sources; Materials testing; Optical modulation; Semiconductor materials; Solids; Voltage measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Properties and Applications of Dielectric Materials, 1997., Proceedings of the 5th International Conference on

Conference_Location

Seoul

Print_ISBN

0-7803-2651-2

Type

conf

DOI

10.1109/ICPADM.1997.616599

Filename

616599