• DocumentCode
    3511315
  • Title

    Design rule development for microwave flip chip applications

  • Author

    Staiculescu, Daniela ; Laskar, Joy ; Mather, John

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    231
  • Lastpage
    234
  • Abstract
    This paper presents a novel approach for analysis of factors to be considered when designing a flip chip package. It includes the design of an experiment and statistical analysis of the outputs. The most significant factors are found to be, from most to least important, the length of the area where the device and the substrate overlap (referred to as conductor overlap), the bump diameter and the width of the coplanar waveguide transmission line launch. These results are valid for conductor overlaps between 300 and 500 μm. For a lower overlap value (120 μm), the bump height also becomes significant. The substrate thickness in the 10 to 25 mil interval is found to be statistically insignificant, and therefore can be eliminated from further analysis
  • Keywords
    MMIC; coplanar waveguides; design of experiments; flip-chip devices; integrated circuit design; integrated circuit interconnections; integrated circuit packaging; statistical analysis; 10 to 25 mil; 120 micron; 300 to 500 micron; bump diameter; conductor overlap length; coplanar waveguide transmission line launch width; design of experiment; design rule development; device-substrate overlap length; flip chip package design; microwave flip chip applications; output statistical analysis; Application software; Conductors; Coplanar waveguides; Design engineering; Flip chip; Input variables; Integrated circuit interconnections; Millimeter wave technology; Packaging; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Performance of Electronic Packaging, 1999
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    0-7803-5597-0
  • Type

    conf

  • DOI
    10.1109/EPEP.1999.819232
  • Filename
    819232