DocumentCode
3511333
Title
/spl delta/f simulation of tearing mode instability
Author
Wan, W. ; Chen, Y. ; Parker, S.E.
Author_Institution
Colorado Univ., Boulder, CO, USA
fYear
2004
fDate
1-1 July 2004
Firstpage
415
Abstract
Summary form only given. The evolution of the collisionless and collisional tearing mode is studied using a three-dimensional particle-in-cell simulation model that uses the /spl delta/f-method with the split-weight scheme to enhance the time step, and a novel algorithm to accurately solve the Ampere´s equation for experimentally relevant /spl beta/ values, /spl beta/ m/sub i//m/sub e//spl Gt/1. We use the model of drift-kinetic electrons and gyrokinetic/adiabatic ions. Linear simulation results are benchmarked with eigenmode analysis for the case of fixed ions, as can be shown that in small box simulations the ions response can be neglected. The nonlinear dynamics of magnetic islands are studied and the results are compared with previous theoretical studies. For large box simulations we have found instabilities like drift kink mode for which ions motion is more important compared to tearing modes. A collision operator is included in the electron drift kinetic equation to study the simulation in the semi-collisional and collisional regimes.
Keywords
drift instability; plasma collision processes; plasma nonlinear processes; plasma simulation; tearing instability; Ampere equation; adiabatic ions; collisional tearing mode; delta-f plasma simulation; drift kink mode; eigenmode analysis; electron drift kinetic equation; gyrokinetic ions; magnetic islands; nonlinear dynamics; tearing mode instability; Contamination; Mechanical engineering; Monte Carlo methods; Particle collisions; Propulsion; Space vehicles;
fLanguage
English
Publisher
ieee
Conference_Titel
Plasma Science, 2004. ICOPS 2004. IEEE Conference Record - Abstracts. The 31st IEEE International Conference on
Conference_Location
Baltimore, MD, USA
ISSN
0730-9244
Print_ISBN
0-7803-8334-6
Type
conf
DOI
10.1109/PLASMA.2004.1340199
Filename
1340199
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