Title :
In search of efficient reliable processor design
Author :
Sato, Toshinori ; Arita, Itsujiro
Author_Institution :
Dept. of Artificial Intelligence, Kyushu Inst. of Technol., Japan
Abstract :
In this paper, we investigate an efficient reliable processor which can detect and recover from transient faults. There are two driving forces to study fault-tolerant techniques for microprocessors. One is deep submicron fabrication technology. Future semiconductor technologies could become more susceptible to alpha particles and other cosmic radiation. The other is increasing popularity of mobile platforms. Recently cell phones are used for applications which are critical to our financial security, such as flight ticket reservation, mobile banking, and mobile trading. In such applications, it is expected that computer systems will always work correctly. From these observations, we have proposed a mechanism which is based on instruction reissue technique for incorrect data speculation recovery and utilizes time redundancy. In order to mitigate overhead caused by including fault-tolerant facility, we evaluate some alternative designs and find that speculatively updating branch predictors and removing redundant memory accesses are very effective.
Keywords :
fault tolerant computing; microprocessor chips; alpha particles; cell phones; cosmic radiation; data speculation recovery; deep submicron fabrication technology; fault-tolerant techniques; flight ticket reservation; instruction reissue technique; microprocessors; mobile banking; mobile trading; reliable processor design; transient faults; Alpha particles; Application software; Banking; Cellular phones; Data security; Fabrication; Fault detection; Fault tolerance; Microprocessors; Process design;
Conference_Titel :
Parallel Processing, 2001. International Conference on
Conference_Location :
Valencia, Spain
Print_ISBN :
0-7695-1257-7
DOI :
10.1109/ICPP.2001.952100