• DocumentCode
    3511445
  • Title

    In search of efficient reliable processor design

  • Author

    Sato, Toshinori ; Arita, Itsujiro

  • Author_Institution
    Dept. of Artificial Intelligence, Kyushu Inst. of Technol., Japan
  • fYear
    2001
  • fDate
    3-7 Sept. 2001
  • Firstpage
    525
  • Lastpage
    532
  • Abstract
    In this paper, we investigate an efficient reliable processor which can detect and recover from transient faults. There are two driving forces to study fault-tolerant techniques for microprocessors. One is deep submicron fabrication technology. Future semiconductor technologies could become more susceptible to alpha particles and other cosmic radiation. The other is increasing popularity of mobile platforms. Recently cell phones are used for applications which are critical to our financial security, such as flight ticket reservation, mobile banking, and mobile trading. In such applications, it is expected that computer systems will always work correctly. From these observations, we have proposed a mechanism which is based on instruction reissue technique for incorrect data speculation recovery and utilizes time redundancy. In order to mitigate overhead caused by including fault-tolerant facility, we evaluate some alternative designs and find that speculatively updating branch predictors and removing redundant memory accesses are very effective.
  • Keywords
    fault tolerant computing; microprocessor chips; alpha particles; cell phones; cosmic radiation; data speculation recovery; deep submicron fabrication technology; fault-tolerant techniques; flight ticket reservation; instruction reissue technique; microprocessors; mobile banking; mobile trading; reliable processor design; transient faults; Alpha particles; Application software; Banking; Cellular phones; Data security; Fabrication; Fault detection; Fault tolerance; Microprocessors; Process design;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Parallel Processing, 2001. International Conference on
  • Conference_Location
    Valencia, Spain
  • ISSN
    0190-3918
  • Print_ISBN
    0-7695-1257-7
  • Type

    conf

  • DOI
    10.1109/ICPP.2001.952100
  • Filename
    952100