• DocumentCode
    3511590
  • Title

    Improving pollen classification with less training effort

  • Author

    Nguyen, N.R. ; Donalson-Matasci, M. ; Shin, Min C.

  • Author_Institution
    Dept. of Comput. Sci., Univ. of North Carolina at Charlotte, Charlotte, NC, USA
  • fYear
    2013
  • fDate
    15-17 Jan. 2013
  • Firstpage
    421
  • Lastpage
    426
  • Abstract
    The pollen grains of different plant taxa exhibit various shapes and sizes. This structural diversity has made the identification and classification of pollen grains an important tool in many fields. Despite the myriad of applications, the classification of pollen grains is still a tedious and time-consuming process that must be performed by highly skilled specialists. In this paper, we propose an automatic classification method to discriminate pollen grains coming from a variety of taxonomic types. First, we develop a new feature that captures the spikes of pollen to improve the classification accuracy. Second, we take advantage of the classification rules extracted from the existing pollen types and apply them to the new types. Third, we introduce a new selection criterion to obtain the most valuable training samples from the unlabeled data and therefore reduce the number of needed training samples. Our experiment demonstrates that the proposed method reduces the training effort of a human expert up to 80% compared to other classification methods while achieving 92% accuracy in pollen classification.
  • Keywords
    biology computing; botany; image classification; image recognition; automatic classification method; classification rules; plant taxa; pollen grain classification; pollen grain identification; pollen grain shape; pollen grain size; pollen spikes; pollen types; selection criterion; structural diversity; training effort reduction; Accuracy; Active contours; Boosting; Feature extraction; Humans; Shape; Training;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Computer Vision (WACV), 2013 IEEE Workshop on
  • Conference_Location
    Tampa, FL
  • ISSN
    1550-5790
  • Print_ISBN
    978-1-4673-5053-2
  • Electronic_ISBN
    1550-5790
  • Type

    conf

  • DOI
    10.1109/WACV.2013.6475049
  • Filename
    6475049