Research on the reliability of SLD through accelerated life testing

As an important component, Super Luminescent Diode (SLD) is the most crucial factor that affects life and reliability of Interferotic Fiber Opitc Gyroscope(IFOG). Therefore, research on the reliability of SLD is the base of research on the reliability of IFOG. Research on the reliability of SLD was processed through accelerated life test (ALT). Based on related theoretic analysis, the sensitive stress was thus decided. By analyzing the failure mechanism and the configuration of SLD, an Arrhenius life-stress relationship was obtained, i.e. the accelerated model. Using Weibull distribution as its life distribution function, reliability assessment was achieved applying MLE data assessment method. And reliability assessment results of SLD at 25degC was gained. By analyzing the reliability assessment results, conclusion can be made that ALT on SLD is feasible.