DocumentCode :
3511881
Title :
Quantitative assessment approach of RET based on interference model
Author :
Yao, Jun ; Liu, Jia ; Zhu, Zhen-Yu
Author_Institution :
Dept. of Syst. Eng., Beihang Univ., Beijing, China
fYear :
2009
fDate :
20-24 July 2009
Firstpage :
1276
Lastpage :
1279
Abstract :
RET (reliability enhancement testing) is the most advanced technology from western countries. RET´s concept, process and stress limit classification were introduced. The basic theory of RET was explained. Interference model was introduced into RET, to settle the problem that RET couldn´t be analyzed quantitatively. The failure mechanism occurred in RET was analyzed by using interference model. By analyzing the interdependence between the operating stress found in RET and the stress in actual operation environment, the formula for reliable probability was deduced. Then an example was given to explain this approach´s feasibility. RET could improve the reliability of products by improving the quality of design and manufacturing process. By using the interference model and the deuced formula, two ways of improving the reliability of products were analyzed. And also, the basic principle of RET was explained based on the model.
Keywords :
failure analysis; probability; reliability; design quality; failure mechanism; interference model; manufacturing process; product reliability; quantitative assessment approach; reliability enhancement testing; reliable probability; stress limit classification; Electronic switching systems; Failure analysis; Interference; Manufacturing processes; Process design; Reliability engineering; Stress; System testing; Systems engineering and theory; Temperature; interference model; quantitative analysis; reliability enhancement testing; reliability estimation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability, Maintainability and Safety, 2009. ICRMS 2009. 8th International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-4903-3
Electronic_ISBN :
978-1-4244-4905-7
Type :
conf
DOI :
10.1109/ICRMS.2009.5270051
Filename :
5270051
Link To Document :
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