DocumentCode :
3511906
Title :
Artifact removal in EEG using Morphological Component Analysis
Author :
Yong, Xinyi ; Ward, Rabab K. ; Birch, Gary E.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of British Columbia, Vancouver, BC
fYear :
2009
fDate :
19-24 April 2009
Firstpage :
345
Lastpage :
348
Abstract :
To reduce the effects of artifacts in electroencephalography (EEG), we propose the use of morphological component analysis (MCA). Taking advantage of the sparse representation of data in overcomplete dictionaries, MCA decomposes EEG signals into parts that have different morphological characteristics. For denoising purpose, the parts related to artifacts are removed. An over complete dictionary is constructed using the discrete cosine transform, Daubechies wavelet basis, and Dirac basis. Movement-related potentials (MRP) and EEG signals contaminated by spikes, eye-blinks, and muscle artifacts caused by eye-brow raising are used to evaluate the performance of the method. The results demonstrate that MCA can be used to decompose the single-channel EEG signals into artifacts and MRP components. The correlation coefficient between the denoised MRP and the original MRP using MCA is significantly higher than that obtained using stationary wavelet transform.
Keywords :
discrete cosine transforms; electroencephalography; independent component analysis; medical signal processing; wavelet transforms; Daubechies wavelet basis; Dirac basis; EEG signals; discrete cosine transform; electroencephalography; morphological component analysis; movement-related potentials; stationary wavelet transform; Dictionaries; Discrete cosine transforms; Discrete wavelet transforms; Electroencephalography; Frequency; Materials requirements planning; Muscles; Noise reduction; Signal representations; Wavelet transforms; Artifacts; Brain-Computer Interface; Denoising; Electroencephalogram; Morphological Component Analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Acoustics, Speech and Signal Processing, 2009. ICASSP 2009. IEEE International Conference on
Conference_Location :
Taipei
ISSN :
1520-6149
Print_ISBN :
978-1-4244-2353-8
Electronic_ISBN :
1520-6149
Type :
conf
DOI :
10.1109/ICASSP.2009.4959591
Filename :
4959591
Link To Document :
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