• DocumentCode
    3511960
  • Title

    Improved generation of probabilistic atlases for the expectation maximization classification

  • Author

    Lotjonen, J. ; Wolz, Robin ; Koikkalainen, Juha ; Thurfjell, Lennart ; Lundqvist, Roger ; Waldemar, Gunhild ; Soininen, Hilkka ; Rueckert, Daniel

  • Author_Institution
    Knowledge Intensive Services, VTT Tech. Res. Centre of Finland, Tampere, Finland
  • fYear
    2011
  • fDate
    March 30 2011-April 2 2011
  • Firstpage
    1839
  • Lastpage
    1842
  • Abstract
    Probabilistic atlases present prior knowledge about the spatial distribution of various structures or tissues in a population, used commonly in segmentation. We propose three methods for generating probabilistic atlases: 1) the atlases are constructed in a template space using dense non-rigid transformations and transformed to the space of unseen data, 2) as the method 1 but atlas selection is performed in addition, and 3) the atlases are constructed directly in the space of the unseen data. The methods were evaluated in the segmentation of the hippocampus in 340 images from the Alzheimer´s Disease Neuroimaging Initiaitve (ADNI). Dice overlaps (similarity index, SI) were 0.84, 0.85 and 0.87 with reference segmentations and the correlation coefficients for the volumes were 0.84, 0.92 and 0.96 for the three methods tested. Our results show clearly the importance of probabilistic atlases in segmentation.
  • Keywords
    diseases; expectation-maximisation algorithm; image classification; image segmentation; medical image processing; neurophysiology; probability; Alzheimer disease neuroimaging initiative; expectation maximization classification; hippocampus segmentation; nonrigid transformations; probabilistic atlas; Accuracy; Alzheimer´s disease; Hippocampus; Image segmentation; Indexes; Probabilistic logic; Alzheimer´s disease; probabilistic atlases; segmentation; structural MRI images;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biomedical Imaging: From Nano to Macro, 2011 IEEE International Symposium on
  • Conference_Location
    Chicago, IL
  • ISSN
    1945-7928
  • Print_ISBN
    978-1-4244-4127-3
  • Electronic_ISBN
    1945-7928
  • Type

    conf

  • DOI
    10.1109/ISBI.2011.5872765
  • Filename
    5872765