• DocumentCode
    3511985
  • Title

    Autism diagnostics by centerline-based shape analysis of the Corpus Callosum

  • Author

    Elnakib, A. ; Casanova, M.F. ; Gimel´farb, Georgy ; Switala, A.E. ; El-Baz, A.

  • Author_Institution
    Bioeng. Dept., Univ. of Louisville, Louisville, KY, USA
  • fYear
    2011
  • fDate
    March 30 2011-April 2 2011
  • Firstpage
    1843
  • Lastpage
    1846
  • Abstract
    Autism severely impairs personal behavior and communication skills, so that improved diagnostic methods are called for. Neuropathological studies have revealed abnormal anatomy of the Corpus Callosum (CC) in autistic brains. We explore a possibility of distinguishing between autistic and normal (control) brains by quantitative CC shape analysis in the 3D magnetic resonance images (MRI). Our approach consists of the three steps: (i) segmenting the CC from a given 3D MRI using the learned CC shape and visual appearance; (ii) extracting a centerline of the CC; and (iii) classifying the subject as autistic or normal based on the estimated length of the centerline of the CC using a k-Nearest neighbor classifier. Experiments revealed significant differences (at the 95% confidence level) between the CC centerlines for 17 normal and 17 autistic subjects. Our initial classification suggests the proposed centerline-based shape analysis of the CC is a promising supplement to the current autism diagnostics.
  • Keywords
    biomedical MRI; brain; feature extraction; image classification; image segmentation; medical disorders; medical image processing; neurophysiology; 3D magnetic resonance images; MRI; abnormal anatomy; autism diagnostics; autistic brains; centerline extraction; centerline-based shape analysis; corpus callosum; image classification; image segmentation; k-nearest neighbor classifier; neuropathology; Biological system modeling; Shape; Autism; Corpus callosum; Diagnostics; Segmentation; Shape analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biomedical Imaging: From Nano to Macro, 2011 IEEE International Symposium on
  • Conference_Location
    Chicago, IL
  • ISSN
    1945-7928
  • Print_ISBN
    978-1-4244-4127-3
  • Electronic_ISBN
    1945-7928
  • Type

    conf

  • DOI
    10.1109/ISBI.2011.5872766
  • Filename
    5872766