DocumentCode :
3511996
Title :
3D shape analysis of the brain cortex with application to autism
Author :
Nitzken, M. ; Casanova, M.F. ; Gimel´farb, G. ; Khalifa, F. ; Elnakib, A. ; Switala, A.E. ; El-Baz, A.
Author_Institution :
Bioeng. Dept., Univ. of Louisville, Louisville, KY, USA
fYear :
2011
fDate :
March 30 2011-April 2 2011
Firstpage :
1847
Lastpage :
1850
Abstract :
To discriminate more accurately between autistic and normal brains, we detect the brain cortex variability using a spherical harmonic analysis that represents a 3D surface supported by the unit sphere with a linear combination of special basis functions, called spherical harmonics (SHs). The proposed 3D shape analysis is carried out in five steps: (i) 3D brain cortex segmentation, with a deformable 3D boundary, controlled by two probabilistic visual appearance models (the learned prior and the estimated current appearance one); (ii) 3D Delaunay triangulation to construct a 3D mesh model of the brain cortex surface; (iii) mapping this model to the unit sphere; (iv) computing the SHs for the surface; and (v) determining the number of the SHs to delineate the brain cortex. We describe the brain shape complexity with a new shape index, the estimated number of the SHs, and use it for K-nearest classification of normal and autistic brains. Initial experiments suggest that our shape index is a promising supplement to the current autism diagnostic techniques.
Keywords :
biomedical MRI; brain; image classification; image segmentation; medical disorders; medical image processing; mesh generation; neurophysiology; 3D Delaunay triangulation; 3D brain cortex segmentation; 3D shape analysis; 3D surface; K-nearest classification; MRI images; autism diagnostic techniques; brain shape complexity; deformable 3D boundary; probabilistic visual appearance models; spherical harmonic analysis; Indexes; Autism; brain cortex segmentation; shape analysis; spherical harmonics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Biomedical Imaging: From Nano to Macro, 2011 IEEE International Symposium on
Conference_Location :
Chicago, IL
ISSN :
1945-7928
Print_ISBN :
978-1-4244-4127-3
Electronic_ISBN :
1945-7928
Type :
conf
DOI :
10.1109/ISBI.2011.5872767
Filename :
5872767
Link To Document :
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