Storage reliability

Author

Rooney, John P.

Author_Institution

Sippican Inc., Marion, MA, USA

fYear

1989

fDate

24-26 Jan 1989

Firstpage

178

Lastpage

182

Abstract

Reviews the methods and models of US Air Force publication RADC-TR-85-91 (Impact of nonoperating periods on equipment reliability). Example calculations are presented, and statistical techniques are used to compare the data from the literature with the RADC-calculated storage failure rates for simple components, systems, and an exotic component. Areas for improvement are noted, including the refinement of the environmental factors, addition to methods to deal with surface-mount components, and (for completeness) a section on nonelectronic components. It is noted that components with a known shelf life should be clearly identified, so that analysts do not attempt to predict a storage failure rate beyond the end of life for those components

Keywords

electronic equipment testing; failure analysis; reliability; statistical analysis; RADC-TR-85-91; RADC-calculated storage failure rates; US Air Force; environmental factors; nonelectronic components; shelf life; statistical techniques; storage reliability; surface-mount components; Assembly systems; Electronic components; Electronic equipment; Environmental factors; Equations; Face recognition; Failure analysis; Missiles; Physics computing; Reliability;

fLanguage

English

Publisher

ieee

Conference_Titel

Reliability and Maintainability Symposium, 1989. Proceedings., Annual

Conference_Location

Atlanta, GA

Type

conf

DOI

10.1109/ARMS.1989.49596

Filename

49596