• DocumentCode
    3512235
  • Title

    -1/+0.8°C error, accurate temperature sensor using 90nm 1V CMOS for on-line thermal monitoring of VLSI circuits

  • Author

    Sasaki, Masahiro ; Ikeda, Makoto ; Asada, Kunihiro

  • Author_Institution
    VLSI Design & Educ. Center, Tokyo Univ., Japan
  • fYear
    2006
  • fDate
    6-9 March 2006
  • Firstpage
    9
  • Lastpage
    12
  • Abstract
    This paper proposes quite accurate four-transistor temperature sensor designed and developed for thermal testing and monitoring of VLSI circuits. The sensor is featured with an extremely small area of 11.6×4.1μm2 and low power consumption of about 25μW. The performance of the sensor is highly linear and the predicted temperature error is merely -1.0∼+0.8°C using two-point calibration within the range of 50∼125°C. The sensor is implemented in ASPLA CMOS 90nm 1P6M process, operated at supply voltage of 1V, and tested successfully.
  • Keywords
    CMOS integrated circuits; VLSI; integrated circuit measurement; temperature sensors; 1 V; 90 nm; VLSI circuits; online thermal monitoring; temperature sensor; thermal testing; two-point calibration; Circuit testing; Diodes; Energy consumption; Linearity; Monitoring; Temperature control; Temperature measurement; Temperature sensors; Very large scale integration; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronic Test Structures, 2006. ICMTS 2006. IEEE International Conference on
  • Print_ISBN
    1-4244-0167-4
  • Type

    conf

  • DOI
    10.1109/ICMTS.2006.1614264
  • Filename
    1614264