DocumentCode :
3512450
Title :
Tracking multiple particles in fluorescence microscopy images via probabilistic data association
Author :
Godinez, W.J. ; Lampe, M. ; Eils, R. ; Müller, B. ; Rohr, K.
Author_Institution :
Dept. Bioinf. & Functional Genomics, Univ. of Heidelberg, Heidelberg, Germany
fYear :
2011
fDate :
March 30 2011-April 2 2011
Firstpage :
1925
Lastpage :
1928
Abstract :
Tracking subcellular structures displayed as `particles´ in fluorescence microscopy images yields quantitative descriptions of the underlying dynamical processes. We have developed an approach for tracking multiple fluorescent particles. Our approach includes a localization scheme using probabilistic data association that combines a top-down strategy driven by the Kalman filter and a bottom-up strategy using standard localization algorithms for fluorescent particles. The combined scheme yields multiple positions that are incorporated to the filter via a combined innovation. To track objects in close proximity, we introduce a support map that adjusts the association probabilities. By using the combined localization scheme in conjunction with the Kalman filter we integrate localization and position estimation. The approach has been successfully applied to synthetic images as well as to real microscopy image sequences and the performance has been quantified.
Keywords :
Kalman filters; biological techniques; biology computing; cellular biophysics; fluorescence; image sequences; object tracking; optical microscopy; position measurement; probability; sensor fusion; Kalman filter; fluorescence microscopy imaging; image sequences; particle tracking; position estimation; probabilistic data association; standard localization algorithms; Atmospheric measurements; Computational modeling; Kalman filters; Microscopy; Particle measurements; Personal digital assistants; Position measurement; Biomedical imaging; microscopy images; tracking; virus particles;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Biomedical Imaging: From Nano to Macro, 2011 IEEE International Symposium on
Conference_Location :
Chicago, IL
ISSN :
1945-7928
Print_ISBN :
978-1-4244-4127-3
Electronic_ISBN :
1945-7928
Type :
conf
DOI :
10.1109/ISBI.2011.5872786
Filename :
5872786
Link To Document :
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