Title :
A fault diagnosis model for embedded software based on FMEA/FTA and bayesian network
Author :
Yang, Shunkun ; Lu, Minyan ; Liu, Bin ; Hao, Bonan
Author_Institution :
Dept. of Syst. Eng., Beihang Univ., Beijing, China
Abstract :
Failure modes and effects analysis (FMEA) and fault tree analysis (FTA) are two effective fault analysis technologies and the integration of them is also applied widely in many industry domains. But when they are used for fault diagnosis, the ability of inference is not very enough and especially they are not suitable to use the fault related symptoms to do some posterior inference. To solve this problem, this paper combines FMEA and FTA based on Bayesian Network (BN) to form a fault diagnosis analysis model. Case study shows that this model has a good FMEA/FTA fusion ability and posterior inference ability for embedded software fault diagnosis.
Keywords :
belief networks; embedded systems; fault diagnosis; fault trees; inference mechanisms; sensor fusion; software fault tolerance; Bayesian network; embedded software fault diagnosis model; failure modes-and-effects analysis; fault tree analysis; information fusion ability; posterior inference ability; Application software; Bayesian methods; Computer industry; Embedded software; Fault diagnosis; Fault trees; Genetic algorithms; Software systems; Systems engineering and theory; US Department of Transportation; Bayesian network; FMEA; FTA; Fault diagnosis;
Conference_Titel :
Reliability, Maintainability and Safety, 2009. ICRMS 2009. 8th International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-4903-3
Electronic_ISBN :
978-1-4244-4905-7
DOI :
10.1109/ICRMS.2009.5270082