DocumentCode
3512535
Title
Impact of GHz disturbances on DC parametric measurements
Author
Tuinhout, Hans P. ; Baltus, Peter G M
Author_Institution
Philips Res., High Tech Campus, Eindhoven, Netherlands
fYear
2006
fDate
6-9 March 2006
Firstpage
71
Lastpage
75
Abstract
RF signals from mobile phones or WLAN transmitters can affect DC parametric measurements. A transistor test structure inside a wafer prober can behave as a GHz receiver when the needles or the manipulators that probe these transistors pick up sufficiently strong GHz signals. This paper shows examples of such occurrences and presents a technique for assessing the vulnerability of parametric measurement systems for GHz signals.
Keywords
bipolar transistors; mobile handsets; radio receivers; radio transmitters; DC parametric measurements; GHz disturbances; GHz receiver; GHz signals; RF signals; WLAN transmitters; mobile phones; transistor test structure; Cables; Circuit testing; Current measurement; Electrostatic measurements; Mobile handsets; Noise measurement; Power measurement; Probes; Time measurement; Vibration measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronic Test Structures, 2006. ICMTS 2006. IEEE International Conference on
Print_ISBN
1-4244-0167-4
Type
conf
DOI
10.1109/ICMTS.2006.1614278
Filename
1614278
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