Title :
Impact of GHz disturbances on DC parametric measurements
Author :
Tuinhout, Hans P. ; Baltus, Peter G M
Author_Institution :
Philips Res., High Tech Campus, Eindhoven, Netherlands
Abstract :
RF signals from mobile phones or WLAN transmitters can affect DC parametric measurements. A transistor test structure inside a wafer prober can behave as a GHz receiver when the needles or the manipulators that probe these transistors pick up sufficiently strong GHz signals. This paper shows examples of such occurrences and presents a technique for assessing the vulnerability of parametric measurement systems for GHz signals.
Keywords :
bipolar transistors; mobile handsets; radio receivers; radio transmitters; DC parametric measurements; GHz disturbances; GHz receiver; GHz signals; RF signals; WLAN transmitters; mobile phones; transistor test structure; Cables; Circuit testing; Current measurement; Electrostatic measurements; Mobile handsets; Noise measurement; Power measurement; Probes; Time measurement; Vibration measurement;
Conference_Titel :
Microelectronic Test Structures, 2006. ICMTS 2006. IEEE International Conference on
Print_ISBN :
1-4244-0167-4
DOI :
10.1109/ICMTS.2006.1614278
