Title :
New power MOSFET technologies optimized for efficient and reliable telecommunication power system
Author :
Choi, Wonsuk ; Son, Dongkook ; Young, Sungmo
Author_Institution :
Power Supply Syst. Team, Fairchild Korea Semicond., Bucheon, South Korea
Abstract :
The world is gradually facing with severe energy crisis and global warming. Under the rapidly changing circumstances that encouraging energy saving, most industry experts agree that new power technologies can play a critical role in the power conversion area. Higher efficiency, power density, and system reliability are always crucial factor for server/telecom power system. The phase-shifted full-bridge and LLC resonant converters are widely used for medium or high power applications and a synchronous rectifier is an essential building block for secondary side of DC-DC converters. In this paper, new high voltage fast recovery super junction MOSFETs and medium voltage shielded gate trench MOSFETs are introduced. In this paper, power MOSFET parameters of newly developed devices and their impact on reliability and efficiency of DC-DC converter is analyzed. Evaluation results in LLC resonant converter with synchronous rectification are showed from experiment results.
Keywords :
DC-DC power convertors; power MOSFET; power conversion; power system reliability; rectifying circuits; resonant power convertors; telecommunication network reliability; telecommunication power supplies; DC-DC converter secondary side building block; LLC resonant converter; energy crisis; energy saving; global warming; high voltage fast recovery super junction MOSFET; medium voltage shielded gate trench MOSFET; phase-shifted full-bridge converter; power MOSFET parameter; power MOSFET technology optimization; power conversion area; power density; server-telecom power system; synchronous rectification; system reliability; telecommunication power system; Capacitance; Logic gates; Power MOSFET; Reliability; Telecommunications; Zero voltage switching;
Conference_Titel :
Applied Power Electronics Conference and Exposition (APEC), 2012 Twenty-Seventh Annual IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4577-1215-9
Electronic_ISBN :
978-1-4577-1214-2
DOI :
10.1109/APEC.2012.6166046