Title :
Fast wavelet-based single-particle reconstruction in Cryo-EM
Author :
Vonesch, Cédric ; Wang, Lanhui ; Shkolnisky, Yoel ; Singer, Amit
Author_Institution :
Program in Appl. & Comput. Math., Princeton Univ., Princeton, NJ, USA
fDate :
March 30 2011-April 2 2011
Abstract :
This paper presents a novel algorithm for the 3D tomographic inversion problem that arises in single-particle electron cryomicroscopy (Cryo-EM). It is based on two key components: 1) a variational formulation that promotes sparsity in the wavelet domain and 2) the Toeplitz structure of the combined projection/back-projection operator. The first idea has proven to be very effective for the recovery of piecewise-smooth signals, which is confirmed by our numerical experiments. The second idea allows for a computationally efficient implementation of the reconstruction procedure, using only one circulant convolution per iteration.
Keywords :
Toeplitz matrices; biological techniques; electron microscopy; image reconstruction; inverse problems; iterative methods; low-temperature techniques; sparse matrices; wavelet transforms; 3D tomographic inversion problem; Toeplitz structure; circulant convolution per iteration; fast wavelet-based single-particle reconstruction; piecewise-smooth signals; projection-back-projection operator; single-particle electron cryomicroscopy; sparsity; wavelet domain; Fourier transforms; Image reconstruction; Kernel; Signal to noise ratio; Three dimensional displays; Tomography; 3D; Inverse problem; Toeplitz structure; electron cryo-microscopy (Cryo-EM); non-uniform FFT; one-norm regularization; projection-slice theorem; single particle reconstruction; sparsity; wavelets;
Conference_Titel :
Biomedical Imaging: From Nano to Macro, 2011 IEEE International Symposium on
Conference_Location :
Chicago, IL
Print_ISBN :
978-1-4244-4127-3
Electronic_ISBN :
1945-7928
DOI :
10.1109/ISBI.2011.5872791
