DocumentCode :
3512755
Title :
The detection of DC arc fault: Experimental study and fault recognition
Author :
Yao, Xiu ; Herrera, Luis ; Huang, Yi ; Wang, Jin
Author_Institution :
Dept. of Electr. & Comput. Eng., Ohio State Univ., Columbus, OH, USA
fYear :
2012
fDate :
5-9 Feb. 2012
Firstpage :
1720
Lastpage :
1727
Abstract :
DC arc fault introduces major safety concerns in a wide variety of power electronic applications. However, the randomness and instability of dc arc makes it difficult to be detected. In this paper, an experimental system to study the characteristics of series dc arc is designed and different tests were conducted in order to determine the influence of different factors to the arc such as gap length, current, etc. During the experiments, the load current was varied from 6 A to 30 A, and dc source voltage was changed from 75 V to 300 V. Also, dc arc test with fixed power supply voltage and load current but changing gap length were conducted to examine the influence of arc length. Based on the experimental results, a primary V-I characteristics study was carried out. Current variation analysis was performed to investigate the pulse patterns of the arc current for detection purposes. High frequency arc impedance under different test conditions was also investigated. Lastly, time frequency analysis was applied to the different arc current signals in order to examine the impacts of factors such as load current, dc bus input voltage to the arc current with respect to frequency domain. The results of this paper provide insights of the dc arc characteristics as well as methods for dc arc fault detection.
Keywords :
arcs (electric); fault diagnosis; power electronics; time-frequency analysis; DC arc test; DC bus input voltage; arc current signal detection; arc length; current 6 A to 30 A; current variation analysis; dc source voltage; fault recognition; frequency domain analysis; gap length; high frequency arc impedance; load current; power electronic applications; power supply voltage; primary V-I characteristic; series DC arc fault detection; series DC arc instability; time frequency analysis; voltage 75 V to 300 V; Circuit faults; Electrodes; Equations; Frequency domain analysis; Impedance; Mathematical model; Resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applied Power Electronics Conference and Exposition (APEC), 2012 Twenty-Seventh Annual IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4577-1215-9
Electronic_ISBN :
978-1-4577-1214-2
Type :
conf
DOI :
10.1109/APEC.2012.6166054
Filename :
6166054
Link To Document :
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