• DocumentCode
    3512785
  • Title

    A novel gate assist circuit for quick and stable driving of SiC-JFETs in a 3-phase inverter

  • Author

    Zushi, Yusuke ; Sato, Shinji ; Matsui, Kohei ; Murakami, Yoshinori ; Tanimoto, Satoshi

  • Author_Institution
    R&D Partnership for Future Power Electron. Technol. (FUPET), Tokyo, Japan
  • fYear
    2012
  • fDate
    5-9 Feb. 2012
  • Firstpage
    1734
  • Lastpage
    1739
  • Abstract
    A novel gate drive circuit for an SiC-JFET in a bridge circuit that ensures a quick and stable switching has been proposed and demonstrated. The gate voltage of an off-state transistor tends to rise up due to a steep drain-source voltage change caused by turning-on of the transistor in the other side of the bridge circuit. Even though the gate terminal is kept in the off-state by a voltage source, the abovementioned steep voltage change induces a non-off-state voltage across the parasitic inductance in the gate wiring. As a result, the capability of an SiC transistor for high switching speed in a bridge circuit is limited. The novel gate assist circuit using a PNP transistor with additional capacitors can overcome this limit. It was verified experimentally that the new gate assist circuit improves the turn-on delay time by approximately six fold and the turn-off time by 72%.
  • Keywords
    driver circuits; invertors; silicon compounds; wide band gap semiconductors; 3-phase inverter; JFET; PNP transistor; SiC; bridge circuit; drain-source voltage; gate assist circuit; gate drive circuit; gate terminal; gate voltage; gate wiring; off-state transistor; turn-on delay time; Capacitance; Capacitors; Logic gates; Switches; Switching circuits; Threshold voltage; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Power Electronics Conference and Exposition (APEC), 2012 Twenty-Seventh Annual IEEE
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    978-1-4577-1215-9
  • Electronic_ISBN
    978-1-4577-1214-2
  • Type

    conf

  • DOI
    10.1109/APEC.2012.6166056
  • Filename
    6166056